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dc.contributor.authorKarlsson, Arne
dc.contributor.authorLødeng, Rune
dc.contributor.authorHaugholt, Karl Henrik
dc.contributor.authorMyhrvold, Elisabeth Meyer
dc.contributor.authorPlassen, Martin
dc.date.accessioned2023-07-06T11:31:47Z
dc.date.available2023-07-06T11:31:47Z
dc.date.created2023-06-27T16:18:21Z
dc.date.issued2023
dc.identifier.citationReview of Scientific Instruments. 2023, 94 (6), 065108.en_US
dc.identifier.issn0034-6748
dc.identifier.urihttps://hdl.handle.net/11250/3076575
dc.description.abstractWe demonstrate a newly developed high-performance fixed-bed reactor combined with an in situ mass analyzer (ISMA). The ISMA is particularly relevant to sub-second time-resolved studies where mass changes occur due to, e.g., chemical reactions and process conditions such as choice of solid, temperature, gas atmosphere, and pressure. The mass is determined from the optically measured oscillation frequency of a quartz element, yielding a mass resolution below 10 μg—typically 2–3 μg—for samples up to ∼500 mg. By placing the quartz element and optical sensor inside stainless steel pipes and providing heat from the outside, the instrument is applicable up to ∼62 bars and 700 °C. By surrounding this core part of the instrument with a suitable feed system and product analysis instruments, in combination with computer control and logging, time-resolved studies are enabled. The instrument with surrounding feed and product analysis infrastructure is fully automated. Emphasis has been put on making the instrument robust, safe, operationally simple, and user-friendly. We demonstrate the ISMA instrument on selected samples.en_US
dc.language.isoengen_US
dc.publisherAIP Publishingen_US
dc.titleHigh-performance fixed-bed in situ mass analyzer - ISMAen_US
dc.title.alternativeHigh-performance fixed-bed in situ mass analyzer - ISMAen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.rights.holderCopyright © 2023 The authorsen_US
dc.source.volume94en_US
dc.source.journalReview of Scientific Instrumentsen_US
dc.source.issue6en_US
dc.identifier.doi10.1063/5.0149970
dc.identifier.cristin2158844
dc.source.articlenumber065108en_US
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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