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dc.contributor.authorDorholt, Ole
dc.contributor.authorHansen, Thor-Erik
dc.contributor.authorHeggelund, Andreas Løkken
dc.contributor.authorKok, Angela
dc.contributor.authorPacifico, Nicola
dc.contributor.authorRøhne, Ole Myren
dc.contributor.authorSandaker, Heidi
dc.contributor.authorStugu, Bjarne
dc.contributor.authorYang, Zongchang
dc.contributor.authorBomben, Marco
dc.contributor.authorRummler, André
dc.contributor.authorWeingarten, Jens
dc.date.accessioned2019-01-31T07:07:23Z
dc.date.available2019-01-31T07:07:23Z
dc.date.created2018-09-23T13:14:30Z
dc.date.issued2018
dc.identifier.citationJournal of Instrumentation. 2018, 13 (8), 1-10.nb_NO
dc.identifier.issn1748-0221
dc.identifier.urihttp://hdl.handle.net/11250/2583215
dc.description.abstractFor the purpose of withstanding very high radiation doses, silicon pixel sensors with a ‘3D’ electrode geometry are being developed. Detectors of this kind are highly interesting for harch radiation environments such as expected in the High Luminosity LHC, but also for space physics and medical applications. In this paper, prototype sensors developed at SINTEF are presented and results from tests in a pion beam at CERN are given. These tests show that these 3D sensors perform as expected with full efficiency at bias voltages between 5 and 15Vnb_NO
dc.description.abstractBeam tests of silicon pixel 3D-sensors developed at SINTEFnb_NO
dc.language.isoengnb_NO
dc.titleBeam tests of silicon pixel 3D-sensors developed at SINTEFnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber1-10nb_NO
dc.source.volume13nb_NO
dc.source.journalJournal of Instrumentationnb_NO
dc.source.issue8nb_NO
dc.identifier.doi10.1088/1748-0221/13/08/P08020
dc.identifier.cristin1612522
dc.relation.projectNorges forskningsråd: 255182nb_NO
cristin.unitcode7401,90,31,0
cristin.unitnameMicrosystems and Nanotechnology
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.fulltextpostprint
cristin.qualitycode1


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