Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production
Journal article, Peer reviewed
![Thumbnail](/sintef-xmlui/bitstream/handle/11250/2430607/SINTEF%2bS17369.pdf.jpg?sequence=5&isAllowed=y)
View/ Open
Date
2010Metadata
Show full item recordCollections
- Publikasjoner fra CRIStin - SINTEF AS [5801]
- SINTEF Digital [2501]