Charge Collection in SOI Microdosimeters and Their Radiation Hardness
dc.contributor.author | Pan, V. A. | |
dc.contributor.author | Tran, Linh | |
dc.contributor.author | Pastuovic, Zeljko | |
dc.contributor.author | Hill, D. | |
dc.contributor.author | Williams, J. | |
dc.contributor.author | Kok, Angela Chun Ying | |
dc.contributor.author | Povoli, Marco | |
dc.contributor.author | Pogossov, A. | |
dc.contributor.author | Perrachi, Stefania | |
dc.contributor.author | Boardman, D | |
dc.contributor.author | Davis, J. | |
dc.contributor.author | Guatelli, S. | |
dc.contributor.author | Petasecca, Marco | |
dc.contributor.author | Lerch, Michael | |
dc.contributor.author | Rosenfeld, Anatoly | |
dc.date.accessioned | 2024-06-27T11:58:41Z | |
dc.date.available | 2024-06-27T11:58:41Z | |
dc.date.created | 2023-04-19T13:29:19Z | |
dc.date.issued | 2023 | |
dc.identifier.citation | IEEE Transactions on Nuclear Science. 2023, 70 (4), 568-574. | en_US |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://hdl.handle.net/11250/3136194 | |
dc.language.iso | eng | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.title | Charge Collection in SOI Microdosimeters and Their Radiation Hardness | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | acceptedVersion | en_US |
dc.source.pagenumber | 568-574 | en_US |
dc.source.volume | 70 | en_US |
dc.source.journal | IEEE Transactions on Nuclear Science | en_US |
dc.source.issue | 4 | en_US |
dc.identifier.doi | 10.1109/TNS.2023.3242267 | |
dc.identifier.cristin | 2141860 | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 |
Tilhørende fil(er)
Denne innførselen finnes i følgende samling(er)
-
Publikasjoner fra CRIStin - SINTEF AS [5801]
-
SINTEF Digital [2501]