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dc.contributor.authorDjenouri, Youcef
dc.contributor.authorSrivastava, Gautam
dc.contributor.authorLin, Jerry Chun-Wei
dc.date.accessioned2022-08-30T10:51:53Z
dc.date.available2022-08-30T10:51:53Z
dc.date.created2021-01-14T13:26:16Z
dc.date.issued2021
dc.identifier.citationIEEE Transactions on Industrial Informatics. 2021, 17 (4), 2947-2955.en_US
dc.identifier.issn1551-3203
dc.identifier.urihttps://hdl.handle.net/11250/3014339
dc.description.abstractThis article introduces a technique known as clustering with particle for object detection (CPOD) for use in smart factories. CPOD builds on regional-based methods to identify smart object data using outlier detection, clustering, particle swarm optimization (PSO), and deep convolutional networks. The process starts by removing noise and errors from the images database by the local outlier factor (LOF) algorithm. Next, the algorithm studies different correlations from the set of images in the database. This creates homogeneous, and similar clusters using the well-known k-means algorithm, and the FastRCNN (fast region convolutional neural network) uses these clusters to design efficient and more focused models. PSO is used to optimize the different parameters including, the number of neighbors of LOF, the number of clusters of k-means, the number of epochs, and the error learning rate for FastRCNN. The inference process benefits from the knowledge provided by training. Instead of considering a complex single model of the whole images database, we consider a simple homogeneous model. To demonstrate the usefulness of our approach, intensive experiments have been carried out on standard images database, and real smart manufacturer data. Our results show that CPOD when compared to baseline object detection solutions is superior in terms of runtime and accuracy.en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.subjectObject detectionen_US
dc.subjectClusteringen_US
dc.subjectParticle swarm optimizationen_US
dc.subjectSmart factoryen_US
dc.subjectDeep learningen_US
dc.titleFast and accurate convolution neural network for detecting manufacturing dataen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber2947-2955en_US
dc.source.volume17en_US
dc.source.journalIEEE Transactions on Industrial Informaticsen_US
dc.source.issue4en_US
dc.identifier.doi10.1109/TII.2020.3001493
dc.identifier.cristin1871345
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode2


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