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dc.contributor.authorZhang, Junjie
dc.contributor.authorRazik, Lukas
dc.contributor.authorJakobsen, Sigurd Hofsmo
dc.contributor.authorD'Arco, Salvatore
dc.contributor.authorBenigni, Andrea
dc.date.accessioned2021-07-07T11:21:58Z
dc.date.available2021-07-07T11:21:58Z
dc.date.created2021-06-14T15:29:41Z
dc.date.issued2021
dc.identifier.issn2079-9292
dc.identifier.urihttps://hdl.handle.net/11250/2763764
dc.description.abstractIn this paper we introduce an approach to accelerate many-scenario (i.e., hundreds to thousands) power system simulations which is based on a highly scalable and flexible open-source software environment. In this approach, the parallel execution of simulations follows the single program, multiple data (SPMD) paradigm, where the dynamic simulation program is executed in parallel and takes different inputs to generate different scenarios. The power system is modeled using an existing Modelica library and compiled to a simulation executable using the OpenModelica Compiler. Furthermore, the parallel simulation is performed with the aid of a message-passing interface (MPI) and the approach includes dynamic workload balancing. Finally, benchmarks with the simulation environment are performed on high-performance computing (HPC) clusters with four test cases. The results show high scalability and a considerable parallel speedup of the proposed approach in the simulation of all scenarios. View Full-Text Keywords: parallel simulation; distributed simulation; object-oriented modeling; equation-based modeling; high-performance computing; message-passing interface; Modelica; power system simulation; common information modelen_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleAn Open-Source Many-Scenario Approach for Power System Dynamic Simulation on HPC Clustersen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThe Authorsen_US
dc.source.volume10en_US
dc.source.journalElectronicsen_US
dc.source.issue11en_US
dc.identifier.doi10.3390/electronics10111330
dc.identifier.cristin1915672
dc.relation.projectNorges forskningsråd: 280967en_US
dc.source.articlenumber1330en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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