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dc.contributor.authorHu, Yu
dc.contributor.authorSchøn, Hendrik
dc.contributor.authorØvrelid, Eivind Johannes
dc.contributor.authorNielsen, Øyvind
dc.contributor.authorArnberg, Lars
dc.date.accessioned2015-09-21T13:20:12Z
dc.date.accessioned2017-01-04T09:52:14Z
dc.date.available2015-09-21T13:20:12Z
dc.date.available2017-01-04T09:52:14Z
dc.date.issued2012
dc.identifier.citationAIP Advances 2012, 2(3)nb_NO
dc.identifier.issn2158-3226
dc.identifier.urihttp://hdl.handle.net/11250/2426234
dc.description-nb_NO
dc.language.isoengnb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleInvestigating thermal donors in n-type Cz silicon with carrier density imagingnb_NO
dc.typeJournal articlenb_NO
dc.date.updated2015-09-21T13:20:12Z
dc.identifier.doi10.1063/1.4754276
dc.identifier.cristin991276


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal