• Effect of the native oxide on the Surface Passivation of Si by Al2O3 

      Getz, Michael; Povoli, Marco; Monakhov, Eduard (Peer reviewed; Journal article, 2021)
      The effect of the native silicon oxide layer on the passivation properties of Al2O3 on p-type Si surfaces has been investigated. This was done by comparing effective carrier lifetime, surface saturation current density, ...
    • Electrochemically driven degradation of chemical solution deposited ferroelectric thin-films in humid ambient 

      Dahl-Hansen, Runar Plunnecke; Polfus, Jonathan Marc; Vøllestad, Einar; Akkopru-Akgun, Betul; Denis, Lyndsey; Coleman, Kathleen; Tyholdt, Frode; Trolier-Mckinstry, Susan E; Tybell, Per Thomas Martin (Peer reviewed; Journal article, 2020)
      The ambient humidity significantly accelerates the degradation of lead zirconate titanate (PZT) films in microelectromechanical systems; the cause of such degradation is under debate. Here, it is shown that the degradation ...
    • Interfacial characterization of Al-Al thermocompression bonds 

      Malik, Nishant; Carvalho, Patricia; Poppe, Erik; Finstad, Terje (Journal article; Peer reviewed, 2016)
      Interfaces formed by Al-Al thermocompression bonding were studied by the transmission electron microscopy. Si wafer pairs having patterned bonding frames were bonded using Al films deposited on Si or SiO2 as intermediate ...