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dc.contributor.authorAbid, Fahim
dc.contributor.authorNiayesh, Kaveh
dc.contributor.authorViken, Egil
dc.contributor.authorStøa-Aanensen, Nina Sasaki
dc.contributor.authorJonsson, Erik
dc.contributor.authorMeyer, Hans Kristian Hygen
dc.date.accessioned2021-07-19T11:48:25Z
dc.date.available2021-07-19T11:48:25Z
dc.date.created2020-08-06T13:09:35Z
dc.date.issued2020
dc.identifier.citationIEEE transactions on dielectrics and electrical insulation. 2020, 27 (4), 1339-1347.en_US
dc.identifier.issn1070-9878
dc.identifier.urihttps://hdl.handle.net/11250/2764771
dc.description.abstractExperimental investigation of the effect of filling pressure on the post-arc dielectric recovery characteristics of nitrogen is reported in this paper. A half-cycle arc current duration of 540 μs followed by a 10 kV pulse with a rise rate of 150 V/μs is applied across the contact gap. The pulse is applied from 10 μs to 10 ms after the current zero. First, a free-burning arc is studied without any forced gas flow. The effect of the gap distance on the recovery process is studied by using two different inter-electrode gaps: 20 mm and 50 mm. The effect of arc current on the recovery process is investigated by using current amplitudes of 275 A and 425 A. Moreover, the effect of forced nitrogen flow near current zero is explored using two different arrangements: self-blast and puffer type. Four different nitrogen filling pressures are studied: 1, 20, 40, and 80 bar, the latter two being in the supercritical region. The experimental results show that, in the free-burning arc configuration, the breakdown voltage of the contact gap increases faster with the increase of the filling pressure. A gap of 50 mm recovers quicker than a 20 mm gap, whereas no strong current dependency is observed on the recovery characteristics in the investigated range. In the free-burning arc configuration, just after the current zero up to approximately 300 μs, the breakdown voltage at high filling pressure is found to be lower than at 1 bar. Forced gas flow, however, significantly enhances the dielectric recovery at a high filling pressure, also in the thermal phase.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.titleEffect of Filling Pressure on Post-Arc Gap Recovery of N2en_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber1339-1347en_US
dc.source.volume27en_US
dc.source.journalIEEE transactions on dielectrics and electrical insulationen_US
dc.source.issue4en_US
dc.identifier.doi10.1109/TDEI.2020.008844
dc.identifier.cristin1822021
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode1


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