dc.contributor.author | Zhan, Wei | |
dc.contributor.author | Granerød, Cecilie Skjold | |
dc.contributor.author | Venkatachalapathy, Vishnukanthan | |
dc.contributor.author | Johansen, Klaus Magnus H | |
dc.contributor.author | Jensen, Ingvild Julie Thue | |
dc.contributor.author | Kuznetsov, Andrej | |
dc.contributor.author | Prytz, Øystein | |
dc.date.accessioned | 2020-12-16T12:01:32Z | |
dc.date.available | 2020-12-16T12:01:32Z | |
dc.date.created | 2017-01-20T14:34:24Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 0957-4484 | |
dc.identifier.uri | https://hdl.handle.net/11250/2719803 | |
dc.description.abstract | Using monochromated electron energy loss spectroscopy in a probe-corrected scanning transmission electron microscope we demonstrate band gap mapping in ZnO/ZnCdO thin films with a spatial resolution below 10 nm and spectral precision of 20 meV. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | IOP Science | en_US |
dc.title | Nanoscale mapping of optical band gaps using monochromated Electron Energy Loss Spectroscopy | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | acceptedVersion | en_US |
dc.rights.holder | This is the accepted manuscript. The published article is available at: https://iopscience.iop.org/article/10.1088/1361-6528/aa5962 | en_US |
dc.source.pagenumber | 11 | en_US |
dc.source.volume | 28 | en_US |
dc.source.journal | Nanotechnology | en_US |
dc.source.issue | 10 | en_US |
dc.identifier.doi | 10.1088/1361-6528/aa5962 | |
dc.identifier.cristin | 1433989 | |
dc.relation.project | NORTEM: 197405 | en_US |
dc.relation.project | Norges forskningsråd: 197411 | en_US |
dc.relation.project | Norges forskningsråd: 221992 | en_US |
dc.relation.project | Norges forskningsråd: 251131 | en_US |
cristin.unitcode | 7401,80,6,2 | |
cristin.unitname | Materialfysikk. Oslo | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 2 | |