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dc.contributor.authorZhan, Wei
dc.contributor.authorGranerød, Cecilie Skjold
dc.contributor.authorVenkatachalapathy, Vishnukanthan
dc.contributor.authorJohansen, Klaus Magnus H
dc.contributor.authorJensen, Ingvild Julie Thue
dc.contributor.authorKuznetsov, Andrej
dc.contributor.authorPrytz, Øystein
dc.date.accessioned2020-12-16T12:01:32Z
dc.date.available2020-12-16T12:01:32Z
dc.date.created2017-01-20T14:34:24Z
dc.date.issued2017
dc.identifier.issn0957-4484
dc.identifier.urihttps://hdl.handle.net/11250/2719803
dc.description.abstractUsing monochromated electron energy loss spectroscopy in a probe-corrected scanning transmission electron microscope we demonstrate band gap mapping in ZnO/ZnCdO thin films with a spatial resolution below 10 nm and spectral precision of 20 meV.en_US
dc.language.isoengen_US
dc.publisherIOP Scienceen_US
dc.titleNanoscale mapping of optical band gaps using monochromated Electron Energy Loss Spectroscopyen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.rights.holderThis is the accepted manuscript. The published article is available at: https://iopscience.iop.org/article/10.1088/1361-6528/aa5962en_US
dc.source.pagenumber11en_US
dc.source.volume28en_US
dc.source.journalNanotechnologyen_US
dc.source.issue10en_US
dc.identifier.doi10.1088/1361-6528/aa5962
dc.identifier.cristin1433989
dc.relation.projectNORTEM: 197405en_US
dc.relation.projectNorges forskningsråd: 197411en_US
dc.relation.projectNorges forskningsråd: 221992en_US
dc.relation.projectNorges forskningsråd: 251131en_US
cristin.unitcode7401,80,6,2
cristin.unitnameMaterialfysikk. Oslo
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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