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dc.contributor.authorChristiansen, Emil
dc.contributor.authorRingdalen, Inga Gudem
dc.contributor.authorBjørge, Ruben
dc.contributor.authorMarioara, Calin Daniel
dc.contributor.authorHolmestad, Randi
dc.date.accessioned2020-10-21T09:13:26Z
dc.date.available2020-10-21T09:13:26Z
dc.date.created2020-05-31T15:42:02Z
dc.date.issued2020
dc.identifier.issn0022-2720
dc.identifier.urihttps://hdl.handle.net/11250/2684102
dc.description.abstractThe image contrast of sheared needle‐like precipitates in the Al‐Mg‐Si alloy system is investigated with respect to shear‐plane positions, the number of shear‐planes, and the active matrix slip systems through multislice transmission electron microscopy image simulations and the frozen phonon approximation. It is found that annular dark field scanning transmission electron microscopy (ADF STEM) images are mostly affected by shear‐planes within a distance ∼6–18 unit cells from the specimen surface, whereas about 5–10 equidistant shear‐planes are required to produce clear differences in HRTEM images. The contrast of the images is affected by the Burgers vector of the slip, but not the slip plane. The simulation results are discussed and compared to experimental data.en_US
dc.language.isoengen_US
dc.publisherWiley Online Libraryen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.subjectTransmisjonselektronmikroskopien_US
dc.subjectTransmission electron microscopyen_US
dc.subjectAluminiumen_US
dc.subjectAluminiumen_US
dc.titleMultislice image simulations of sheared needle‐like precipitates in an Al‐Mg‐Si alloyen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holder©2020 The Authors.Journal of Microscopypublished by John Wiley & Sons Ltd on behalf of Royal Microscopical SocietyThis is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided theoriginal work is properly cited.en_US
dc.subject.nsiVDP::Kondenserte fasers fysikk: 436en_US
dc.subject.nsiVDP::Condensed matter physics: 436en_US
dc.source.pagenumber265-273en_US
dc.source.volume279en_US
dc.source.journalJournal of Microscopyen_US
dc.source.issue3en_US
dc.identifier.doi10.1111/jmi.12901
dc.identifier.cristin1813341
dc.relation.projectNorges forskningsråd: 231762en_US
dc.relation.projectNorges forskningsråd: NN9158Ken_US
dc.relation.projectNorges forskningsråd: 269905en_US
dc.relation.projectNorges forskningsråd: 237885en_US
dc.relation.projectNorges forskningsråd: 197405en_US
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cristin.fulltextoriginal
cristin.fulltextoriginal
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