Browsing Publikasjoner fra CRIStin - SINTEF AS by Author "Øvrelid, Eivind Johannes"
Now showing items 1-5 of 5
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Energi og industri - Mulighetsrom verdikjeder - NHO Veikart for fremtidens næringsliv
Støa, Petter; Røkke, Nils Anders; Størset, Sigmund Østtveit; Spooren, Rudie; Knutstad, Gaute A. Johansen; Dahl, Nina; Akporiaye, Duncan; Bredesen, Rune; Sand, Gunnar; Tveten, Erlend Grytli; Mortensholm, Stein Kleppe; Steenstrup-Duch, Anne; Mehammer, Eirill Bachmann; Schäffer, Linn Emelie; Sandquist, Judit; Vullum-Bruer, Fride; Sheridan, Edel Maria; Alnæs, Lisbeth-Ingrid; Høgaas, Per Helge; Lademo, Odd-Geir; Øvrelid, Eivind Johannes (SINTEF Rapport;2019:01139, Research report, 2019)Kan fremtidig verdiskaping innen energi og industri opprettholde Norge som bærekraftig velferdsnasjon, samtidig som vi oppfyller våre forpliktelser i internasjonale klimaavtaler og løser egne utfordringer i tråd med FNs ... -
Investigating thermal donors in n-type Cz silicon with carrier density imaging
Hu, Yu; Schøn, Hendrik; Øvrelid, Eivind Johannes; Nielsen, Øyvind; Arnberg, Lars (Journal article, 2012) -
Investigation of pinholes in Czochralski silicon ingots in relation to structure loss
Sortland, Øyvind Sunde; Øvrelid, Eivind Johannes; M'hamdi, Mohammed; Di Sabatino Lundberg, Marisa (Journal article; Peer reviewed, 2019) -
Statistical analysis of structure loss in Czochralski silicon growth
Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (Peer reviewed; Journal article, 2019)In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ... -
Statistical Analysis of Structure Loss in Czochralski Silicon Growth
Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (SiliconPV 2019, THE 9TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS;2019, Chapter; Peer reviewed, 2019)In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ...