Blar i SINTEF Industri på tidsskrift "Nano Letters"
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Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric Oxide
(Peer reviewed; Journal article, 2021)Dislocations are 1D topological defects with emergent electronic properties. Their low dimensionality and unique properties make them excellent candidates for innovative device concepts, ranging from dislocation-based ...