Browsing Publikasjoner fra CRIStin - SINTEF Manufacturing by Journals "Atomic spectroscopy"

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Depth profiling at a steel-aluminum interface using slow-flow direct current glow discharge mass spectrometry

Paudel, Gagan; Langelandsvik, Geir; Khromov, Sergey; Arbo, Siri Marthe; Westermann, Ida; Roven, Hans Jørgen; Di Sabatino Lundberg, Marisa (Peer reviewed; Journal article, 2021)

Direct current glow discharge mass spectrometry (dc-GDMS), which relies on sector field mass analyzers, is not commonly used for depth profiling applications because of its slow data acquisition. Nevertheless, dc-GDMS has ...