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dc.contributor.authorZhen, Yingpeng
dc.contributor.authorJelle, Bjørn Petter
dc.contributor.authorGao, Tao
dc.date.accessioned2020-10-08T10:46:08Z
dc.date.available2020-10-08T10:46:08Z
dc.date.created2020-07-10T22:40:56Z
dc.date.issued2020
dc.identifier.citationAnalytical Science Advances. 2020, 1 124-131.en_US
dc.identifier.issn2682-5452
dc.identifier.urihttps://hdl.handle.net/11250/2681733
dc.description.abstractTungsten oxide (WO3) thin films with various thicknesses of approximately 36, 72, 108, and 180 nm were prepared using radio frequency sputtering method. Film thickness can be controlled at nanoscale. In addition, X‐ray diffraction, scanning electron microscopy, and Fourier transform infrared spectroscopy were utilized for investigating morphologies and microstructures of as‐prepared WO3 thin films. Moreover, optical properties of the WO3 nanofilms were characterized using ultraviolet‐visible‐near infrared spectroscopy. Transmittance of WO3 films changed during the electrochemical cycles. WO3 films with various thicknesses give various transmittance modulation between colored and bleached states. WO3 films with a thickness of approximately 108 nm had the largest transmittance modulation among various film thicknesses, about 66% measured at 550 nm. Results showed that the value of transmittance of colored samples decreased with increasing film thickness. However, transmittance of bleached samples was not influenced significantly by their thickness.en_US
dc.language.isoengen_US
dc.rightsCC BY 4.0*
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/*
dc.subjectElectrochromic windowsen_US
dc.subjectNanofilm thicknessen_US
dc.subjectSmart windowsen_US
dc.subjectThin nanofilmen_US
dc.subjectTungsten oxideen_US
dc.titleElectrochromic Properties of WO3 Thin Films: The Role of Film Thicknessen_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holder© 2020 The authorsen_US
dc.subject.nsiVDP::Teknologi: 500en_US
dc.source.pagenumber124-131en_US
dc.source.volume1en_US
dc.source.journalAnalytical Science Advancesen_US
dc.identifier.doi10.1002/ansa.202000072
dc.identifier.cristin1819235
dc.relation.projectNorges forskningsråd: 193830en_US
dc.relation.projectNorges forskningsråd: 245963/F50en_US
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