dc.contributor.author | Nærland, Tine Uberg | |
dc.contributor.author | Haug, Halvard | |
dc.contributor.author | Angelskår, Hallvard | |
dc.contributor.author | Søndenå, Rune | |
dc.contributor.author | Marstein, Erik Stensrud | |
dc.contributor.author | Arnberg, Lars | |
dc.date.accessioned | 2017-08-24T08:34:57Z | |
dc.date.available | 2017-08-24T08:34:57Z | |
dc.date.created | 2013-10-10T11:52:13Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | IEEE Journal of Photovoltaics. 2013, 3 (4), 1265-1270. | nb_NO |
dc.identifier.issn | 2156-3381 | |
dc.identifier.uri | http://hdl.handle.net/11250/2451701 | |
dc.description.abstract | Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an externally controlled bias lamp for in-situ illumination between measurements. Logarithmic plots of the time-resolved lifetime decays clearly displayed the previously reported rapid and slow decays, but a satisfactory fit to a single exponential function could not be achieved. We found, however, that both decay curves, for all the investigated samples, can be fitted very well to the solution of a simple second-order rate equation. This indicates that the defect generation process can be described by second-order reaction kinetics. The new information is used to discuss the role of holes in the defect reaction and the rate-determining steps of the rapid and slow defect reactions. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.no | * |
dc.title | Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 1265-1270 | nb_NO |
dc.source.volume | 3 | nb_NO |
dc.source.journal | IEEE Journal of Photovoltaics | nb_NO |
dc.source.issue | 4 | nb_NO |
dc.identifier.doi | 10.1109/JPHOTOV.2013.2278663 | |
dc.identifier.cristin | 1056694 | |
dc.relation.project | Norges forskningsråd: 181884 | nb_NO |
cristin.unitcode | 7401,90,31,0 | |
cristin.unitname | Mikrosystemer og nanoteknologi | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |