• SOI Thin Microdosimeters for High LET Single Event Upset Studies in Fe, O, Xe and Cocktail Ion Beam Fields 

      James, Benjamin; Tran, Linh T.; Bolst, David; Perrachi, Stefania; Davis, Jeremy; Prokopovich, Dale A.; Guatelli, Susanna; Petasecca, Marco; Lerch, Michael L.F.; Povoli, Marco; Kok, Angela; Goethem, Marc-Jan; Nancarrow, Mitchell; Matsufuji, Naruhiro; Jackson, Michael; Rosenfeld, Anatoly B. (Journal article; Peer reviewed, 2019)
      The response of a 5 μm thin silicon on insulator (SOI) 3D microdosimeter was investigated for single event upset applications by measuring the LET of different high LET ions. The charge collection characteristics of the ...
    • Thin Silicon Microdosimeter utilizing 3D MEMS Fabrication Technology: Charge Collection Study and its application in mixed radiation fields 

      Tran, Linh T.; Chartier, Lachlan; Prokopovich, Dale A.; Bolst, David; Povoli, Marco; Summanwar, Anand; Kok, Angela; Pogossov, A.; Petasecca, Marco; Guatelli, S.; Reinhard, Mark I.; Lerch, Michael; Nancarrow, Mitchell; Matsufuji, Naruhiro; Jackson, Michael; Rosenfeld, Anatoly B. (Journal article; Peer reviewed, 2017)
      New 10-μm-thick silicon microdosimeters utilizing 3-D technology have been developed and investigated in this paper. The TCAD simulations were carried out to understand the electrical properties of the microdosimeters’ ...