Blar i SINTEF Industri på tidsskrift "Nano Letters"

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    • Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric Oxide 

      Evans, Donald; Småbråten, Didrik Rene; Holstad, Theodor Secanell; Vullum, Per Erik; Mosberg, Aleksander Buseth; Yan, Zewu; Bourret, Edith; Van Helvoort, Antonius; Selbach, Sverre Magnus; Meier, Dennis (Peer reviewed; Journal article, 2021)
      Dislocations are 1D topological defects with emergent electronic properties. Their low dimensionality and unique properties make them excellent candidates for innovative device concepts, ranging from dislocation-based ...