Browsing SINTEF Industri by Journals "Micron"
Now showing items 1-2 of 2
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Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy
(Peer reviewed; Journal article, 2017)Scanning transmission electron microscopy (STEM) coupled with energy-dispersive X-ray spectroscopy (EDS) is a common technique for chemical mapping in thin samples. Obtaining high-resolution elemental maps in the STEM is ... -
Elemental electron energy loss mapping of a precipitate in a multi-component aluminium alloy
(Peer reviewed; Journal article, 2016)The elemental distribution of a precipitate cross section, situated in a lean Al-Mg-Si-Cu-Ag-Ge alloy, has been investigated in detail by electron energy loss spectroscopy (EELS) and aberration corrected high angle annular ...