Browsing SINTEF Open by Author "Nærland, Tine Uberg"
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Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation
Nærland, Tine Uberg; Haug, Halvard; Angelskår, Hallvard; Søndenå, Rune; Marstein, Erik Stensrud; Arnberg, Lars (Journal article; Peer reviewed, 2013)Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an ...