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dc.contributor.authorTran, Linh T.
dc.contributor.authorChartier, Lachlan
dc.contributor.authorProkopovich, Dale A.
dc.contributor.authorBolst, David
dc.contributor.authorPovoli, Marco
dc.contributor.authorSummanwar, Anand
dc.contributor.authorKok, Angela
dc.contributor.authorPogossov, A.
dc.contributor.authorPetasecca, Marco
dc.contributor.authorGuatelli, S.
dc.contributor.authorReinhard, Mark I.
dc.contributor.authorLerch, Michael
dc.contributor.authorNancarrow, Mitchell
dc.contributor.authorMatsufuji, Naruhiro
dc.contributor.authorJackson, Michael
dc.contributor.authorRosenfeld, Anatoly B.
dc.date.accessioned2018-02-19T09:16:32Z
dc.date.available2018-02-19T09:16:32Z
dc.date.created2018-02-13T15:57:17Z
dc.date.issued2017
dc.identifier.citationIEEE Transactions on Nuclear Science. 2017, 65 (1), 467-472.nb_NO
dc.identifier.issn0018-9499
dc.identifier.urihttp://hdl.handle.net/11250/2485559
dc.description.abstractNew 10-μm-thick silicon microdosimeters utilizing 3-D technology have been developed and investigated in this paper. The TCAD simulations were carried out to understand the electrical properties of the microdosimeters’ design. A charge collection study of the devices was performed using 5.5-MeV He2+ ions which were raster scanned over the surface of the detectors and the charge collection median energy maps were obtained and the detection yield was also evaluated. The Devices were tested in a 290 MeV/u carbon ion beam at the Heavy Ion Medical Accelerator in Chiba (HIMAC) in Japan. Based on the microdosimetric measurements, the quality factor and dose equivalent out of field were obtained in a mixed radiation field mimicking the radiation environment for spacecraft in deep space.nb_NO
dc.language.isoengnb_NO
dc.titleThin Silicon Microdosimeter utilizing 3D MEMS Fabrication Technology: Charge Collection Study and its application in mixed radiation fieldsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionsubmittedVersionnb_NO
dc.source.pagenumber467-472nb_NO
dc.source.volume65nb_NO
dc.source.journalIEEE Transactions on Nuclear Sciencenb_NO
dc.source.issue1nb_NO
dc.identifier.doihttps://doi.org/10.1109/TNS.2017.2768062
dc.identifier.cristin1564867
cristin.unitcode7401,90,31,0
cristin.unitnameMikrosystemer og nanoteknologi
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode1


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