dc.contributor.author | Gastinger, Kay | |
dc.contributor.author | Johnsen, Lars | |
dc.date.accessioned | 2017-02-13T13:29:28Z | |
dc.date.available | 2017-02-13T13:29:28Z | |
dc.date.created | 2012-06-26T14:16:04Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Proceedings of SPIE, the International Society for Optical Engineering. 2010, 7387 . | nb_NO |
dc.identifier.issn | 0277-786X | |
dc.identifier.uri | http://hdl.handle.net/11250/2430607 | |
dc.language.iso | eng | nb_NO |
dc.title | Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.source.pagenumber | 9 | nb_NO |
dc.source.volume | 7387 | nb_NO |
dc.source.journal | Proceedings of SPIE, the International Society for Optical Engineering | nb_NO |
dc.identifier.doi | 10.1117/12.871609 | |
cristin.unitcode | 7401,90,0,0 | |
cristin.unitcode | 7401,90,41,0 | |
cristin.unitname | SINTEF IKT | |
cristin.unitname | Optiske målesystemer og dataanalyse | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |