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Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production

dc.contributor.authorGastinger, Kay
dc.contributor.authorJohnsen, Lars
dc.date.accessioned2017-02-13T13:29:28Z
dc.date.available2017-02-13T13:29:28Z
dc.date.created2012-06-26T14:16:04Z
dc.date.issued2010
dc.identifier.citationProceedings of SPIE, the International Society for Optical Engineering. 2010, 7387 .nb_NO
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/11250/2430607
dc.language.isoengnb_NO
dc.titleNear infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell productionnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.source.pagenumber9nb_NO
dc.source.volume7387nb_NO
dc.source.journalProceedings of SPIE, the International Society for Optical Engineeringnb_NO
dc.identifier.doi10.1117/12.871609
cristin.unitcode7401,90,0,0
cristin.unitcode7401,90,41,0
cristin.unitnameSINTEF IKT
cristin.unitnameOptiske målesystemer og dataanalyse
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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